Semiconductor Components Industries, LLC

Agustin B Hernandez

Airell Richard Clark, Ii

Timothy F Brown

Dennis Robert Engelbrecht

Ignacio Jose Perez

Raymond Allen Davis

Yan Ping Lim

Various embodiments of the present technology may comprise a method and apparatus for pixel readout. The method and apparatus may comprise a pixel array capable of reading out one or more non-rectilinear subsets of the pixel array to form a non-rectilinear primary image. The one or more non-rectilinear subsets may be selected according to a desired rectilinear output image, wherein the rectilinear output image is formed using only the one or more subsets. The primary image may then be transformed to form the rectilinear output image.

Methods and apparatus for selective pixel readout for image transformation

An imaging system with real-time digital testing capabilities verifies the functionality of image processing circuitry used to process pixel data signals read out from a pixel array during imaging operations. Image processing circuitry may process a data frame read from an imaging array that includes multiple regions of imaging and non-imaging data. Digital test patterns may be generated to test the functionality of specific image processing blocks. Test patterns may correspond to or represent imaging data or non-imaging data from regions of the output readout frame. A checksum generator generates a test pattern checksum for output of a subset of the image processing blocks that were provided with a given test pattern. The test pattern checksum may be compared to a predetermined checksum of the output of properly functioning image processing blocks provided with test patterns equivalent to the given test pattern.

Imaging systems with real-time digital testing capabilities

Growing community of inventors

Albany, OR, United States of America

Agustin B Hernandez