Samsung Electronics Co., Ltd.

Ae-yong Chung

Kyeong-seon Shin

Ki-Sang Kang

Eun-Seok Lee

Hwa-Cheol Lee

Se-rae Cho

A method and system for testing a semiconductor device is disclosed. The method provides an integrated test program defined by a plurality of test items, and a test program defined by a sub-set of the test items. Test data is derived by batch sample testing of the semiconductor device, and an error rate for a test item is computed and then compared to a reference data value. On the basis of the comparison between the error rate and the reference data value, the test program may be modified in real-time.

Real-time optimized testing of semiconductor device

Example embodiments may provide a method of testing semiconductor devices by identifying units of lots and a test tray such that a plurality of lots having semiconductor devices may be continuously tested by a handler. Example embodiments may also provide a handler used to test the semiconductor devices.

Growing community of inventors

Cheonan-si, South Korea

Ae-yong Chung