Motorola Corporation

Adolph C Naujoks

William B Mullen, Iii

Rudy Yorio

Andrzej T Guzik

Robert W Pennisi

Thomas J Swirbel

Danny E Ross

Juan O Alfonso

Peggy L Clark

Ray D Pearson

Angelita Alarcon

Ileana Isern-Flecha

A piezoelectric switch (10) is made by laminating one piezoelectric film (16) on the top and a second piezoelectric film (18) on the bottom sides of a stiff central core (14). The central core has one or more actuation areas or poppels (12) formed therein. Each piezoelectric film has an electrically conductive portion (15, 17) formed directly over the actuating area. When the actuating area on the laminate is depressed (11), the piezoelectric films each generate an electric signal that is sent through the electrically conductive portions, thus creating a switching signal.

Piezoelectric switch

A frequency domain switch (100) utilizes an array of cantilevered beams (108) laminated with a piezoelectric material (126). Each of the beams has a unique geometry, and produces a sinusoidal electrical signal in the piezoelectric film that is assignable only to one of the cantilevered beams. When a free end of one of the cantilevered beams is deflected, it produces a signal that is analyzed by suitable circuitry (410-440) to read the position of the switch.

Switching method using a frequency domain piezoelectric switch

A manufacturing environment(100) includes test equipment (130) that tests circuitry (110) for functional operation. An electromagnetic probe (137) is operated adjacent to a substrate having electronic circuitry to be tested (310). The electromagnetic probe is activated to directly stimulate a localized portion of the electronic circuitry with a wireless signal (320). Functional operation of the circuitry is determined by measuring the response of the electronic circuitry (330, 340). In one embodiment, an array of electromagnetic probes is operated to receive near-field electromagnetic emissions emanating from the circuitry. These emissions are measured and an electromagnetic profile generated for a portion of the circuitry (330). The electromagnetic profile is analyzed to determine functional operation of the circuitry (340).

Method and apparatus for testing electronic circuitry in a manufacturing

A conformal shield (10) includes a conformal shield base (15), and a conductive layer (16). The conformal shield base (10) has a first conformable insulating material (12) having a characteristic softening point at a first temperature. A second conformable insulating material (14), which has a characteristic softening point at temperature higher than the first temperature, is overlaid on the first conformable insulating material (12). The conductive layer (16) is disposed on the conformal shield base (15) to form the shield (10).

Conformal shield and method for forming same

A pivotable spring probe (30) includes a housing (36) having an opening, a plunger (34) within and guided by the housing, the plunger being slidingly movable between an extended position and a retracted position, a pivotable contact head (32) mounted on the plunger for making electrical contact with a conductive surface external to the housing, and a spring (42) mounted on the bottom of the plunger for biasing the plunger towards the housing opening.

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Hallandale, FL, United States of America

Adolph C Naujoks