International Business Machines Corporation

Universidade Federal De Minas Gerais - Ufmg

Instituto Nacional De Metrologia Qualidade E Technologia-immetro

Instituto Nacional De Metrologia Qualidade E Tecnologia—inmetro

Universidade Federal De Menas Gerais-ufmg

Ado Jorio De Vasconcelos

Mathias B Steiner

Michael Engel

Carlos Alberto Achete

Luiz Gustavo De Oliveira Lopes Cançado

Wagner Nunes Rodrigues

Thiago De Lourenço E Vasconcelos

Bruno Santos De Oliveira

Cassiano Rabelo E Silva

Ricardo Luis Ohta

Ademir Ferreira Da Silva

Benjamin Fragneaud

Bráulio Soares Archanjo

Braulio Soares Archanjo

Douglas Dos Santos Ribeiro

Hudson Miranda

Luiz Gustavo Cancado

Cassiano Rabelo

Caroline Arantes Da Silva Wetzstein

Rogerio Valaski

A growth chamber chip includes a base surrounding a growth chamber; a growth medium within the growth chamber; a sensor package within the growth chamber; a sensor feedthrough extending from the sensor package through a portion of the base to an outer surface of the base; and a transparent seal covering the growth chamber. In one or more embodiments, the base includes a nutrient channel connected in fluid communication with the growth medium and exposed to an outer surface of the base. One or more embodiments provide an array of growth chamber chips, with a movable arm that is movable across the array to individually scan each of the growth chamber chips.

Miniaturized precision agriculture

A calibration apparatus for a tip-enhanced Raman microscope includes a substrate; a two-dimensional Raman scatterer that is mounted on an upper surface of the substrate; and a well-defined topographic structure that is formed at the upper surface of the substrate. The topographic structure may include convex geometric shapes such as triangles and squares arranged in one or more periodic lattices. Calibration is via adjusting a focal length of a laser beam until a signal from a spectrometer repeatedly exhibits a stepped response when a focal point of the laser beam traverses an edge of a two-dimensional Raman scatterer, then adjusting the relative lateral positions of a scanning probe microscope probe tip and the focal point until the signal from the spectrometer and a signal from the scanning probe microscope repeatedly change within an acceptable time delay while the focal point and the probe tip traverse edges of the topographic structure.

Calibrating tip-enhanced Raman microscopes

Described is a device for use in scanning probe microscopy and to a method for manufacturing same. The metallic device has a single body with two parts, wherein the second part has a submicrometric point that defines a nanoscale apex. Also provided is a method for manufacturing a high optical efficiency probe for scanning probe microscopy.

Metallic device for scanning probe microscopy and method for manufacturing same

The present invention relates to a metallic device for near-field optical microscopy and spectroscopy, as well as to a method of preparing it. Said device comprises a single body () with longitudinal prolongation (), nanometric apex () and has at least one trimming () on its surface, being applied as a probe of high optical efficiency, with adequate dimensions and details that enable the best photon-plasmon coupling, enabling the analysis, with high space resolution, of structures of nanometric dimensions with high efficiency and reproducibility.

Metallic device for scanning near-field optical microscopy and spectroscopy and method for manufacturing same

Growing community of inventors

Belo Horizonte, Brazil

Ado Jorio De Vasconcelos