Hewlett-packard Development Company, L.p.

Adnan A Siddiquie

Fangyong Dai

Earl W Moore

Steven S Homer

Jeffrey A Lev

Michael J Dougherty

Luis C Armendariz

James Scott Love

Riley B Norman

Wan-Li Zhang

An input/output ('I/O') port control system is provided. The system can include an I/O controller () comprising a power input () and an operably connected I/O interface (). A power supply () and switch () can be operably connected to the power input. A detector () can be operably connected to the I/O interface and to the switch. The detector can be adapted to close the switch when an electrical circuit is completed through the I/O interface.

I/O control systems and methods

Interface systems and methods are provided. An interface system can include a first isolator () and a second isolator () coupled to a modular interface (). The interface can include a plurality of conductors (). The first isolator can be coupled to a first signal format compliant first input/output (I/O) device (). The second isolator can be coupled to a second signal format compliant second I/O device (). The first isolator can pass a first signal format compliant signal to, and suppress the reflection of at least a portion of a second signal format compliant signal from, the first I/O device. The second isolator can at least partially block a first signal format compliant signal from, and to pass a second signal format compliant signal to, the second I/O device.

Modular interface systems and methods

An electronic device is provided, the electronic device having an anti-theft interface. If damage to the anti-theft interface is detected, the electronic device enters a user authentication mode.

Damage detection for an anti-theft interface

A system for monitoring a connection to an active pin of an integrated circuit (IC) die, includes an input/output (I/O) cell of an IC die, where the I/O cell is bonded to a bonding pad on a ball grid array (BGA) substrate. The system includes a test point on a printed circuit board (PCB) coupled to the bonding pad which forms an electrical/conductive pathway between the test point and the I/O cell. The system includes a clock waveform injected through a resistor into the test point.

Active pin connection monitoring system and method

A system for calibrating a digitizing pen applies a known actual pen force to a tip of the digitizing pen, infers an indicated pen force from a pen force signal sent by the digitizing pen, and computes a correction, based on the actual and indicated pen forces, to be applied to a future indicated force reading.

Growing community of inventors

Houston, TX, United States of America

Adnan A Siddiquie