O. I. Corporation, Inc.

Spectro Analytical Instruments Gmbh & Co. Kg

Spectro Analytical Instruments Gmbh

Adi A Scheidemann

Dirk Ardelt

Mark W Dassel

Clare Regimbal Long

Gottfried P Kibelka

Eustathios Vassiliou

M Bonner Denton

Mark Wadsworth

Ulrich Heynen

Mark S McGraw

An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.

Simultaneous inorganic mass spectrometer and method of inorganic mass spectrometry

A focal plane detector assembly of a mass spectrometer includes an ion detector configured to detect ions crossing a focal plane of the spectrometer and an electrically conductive mesh lying in a plane parallel to the focal plane, positioned such that ions exiting a magnet of the mass spectrometer pass through the mesh before contacting the ion detector. The mesh is maintained at a low voltage potential, relative to a circuit ground, which shields ions passing through the magnet from high voltage charges from other devices, such as microchannel plate electron multipliers. The mesh may be mounted directly to the magnet or positioned some distance away. The detector array may include any suitable device, including a faraday cup detector array, a strip charge detector array, or a CCD detector array.

Focal plane detector assembly of a mass spectrometer

An apparatus for detecting particles, comprising a plurality of electrically conductive structures disposed on a support element. The structures are electrically insulated from one another and each structure can be electrically connected to an electronic read-out device. The structures receive a beam of particles in a direction forming an angle of incidence with the support element. A trough is disposed between each two successive structures as viewed in the beam direction. And at least partial overlap exists between each two successive structures. The apparatus can be disposed in the focal plane of a mass spectrometer.

Apparatus for detecting particles

Mass spectrometer systems for measuring mass/charge ratios of analytes are described. A mass spectrometer system includes a vacuum flange, a PCB base plate coupled to the vacuum flange, and an ion optic assembly coupled to the PCB base plate. The PCB base plate may include signal-processing electronics. The system may include an electrical cable coupled to the PCB base plate for supplying power, control, and I/O to the ion optic assembly and the signal processing electronics. Alternatively, a mass spectrometer system includes a PCB base plate and an ion optic assembly. The PCB base plate has a sealant portion and an electrical portion. The ion optic assembly is coupled to the electrical portion. The system may include a vacuum housing for enclosing the ion optic assembly. The vacuum housing is coupled to the sealant portion of the PCB base plate for sustaining a vacuum while the system is in operation.

Optical bench for a mass spectrometer system

An ICP mass spectrometer comprising an ICP ion source, a mass analyzer having a magnetic sector field, a detector, an extraction element in the form of an ion funnel for transferring the generated ions into the mass analyzer and arranged between the ICP ion source and the mass analyzer, and a transport optics arranged between the ion funnel and the mass analyzer.

ICP mass spectrometer

A mass spectrometer suitable to measure both positive and negative particles, such as ions for example in a vacuum chamber. This spectrometer is provided with a turnable permanent magnet segment, which provides the gap of a yoke with adequate magnetic flux having the appropriate direction to separate the positive or the negative particles. Changing the polarity adjusts the flight path of the ions. Thus, negatively charged ions and positively charged ions will follow similar flight paths under opposite polarities, permitting the use of a single array of detectors. One or more coils may be used in place of or in addition to the turnable permanent magnet segment in order to provide the appropriate magnetic flux to the gap, and/or facilitate the turning process of the turnable magnet segment. The turnable magnet and/or the coils may be inside or outside the vacuum chamber. The detector may comprise at least one detector area, two charge mode amplifiers coupled to the detector area, a first CCD shift register coupled to a first one of the charge mode amplifiers and a second CCD shift register coupled to a second one of the charge mode amplifiers.

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Baden, Switzerland

Adi A Scheidemann