Hifi Engineering Inc.

Adekunle Adeyemi

Seyed Ehsan Jalilian

John Hull

Daniel Huang

A computer-implemented method of providing access to interferometric system data stored in a data repository. A query that includes a data parameter identifier is received. The data repository is accessed and the interferometric system data is stored in the data repository using a data structure that has one or more data parameter arrays and one or more corresponding data group members. Each data group member includes one or more data arrays each associated with a data parameter in the corresponding data parameter array. Using the data parameter identifier, one or more target data parameters are determined from among the one or more data parameter arrays. One or more target data arrays that correspond to the one or more target data parameters are determined from among the one or more data arrays. The interferometric system data, which is in the one or more target data arrays, is extracted.

Methods and systems for providing access to interferometric system data

There is provided a system for determining multiple baselines for detecting events in a conduit. The system comprises an optical fiber interrogator for interrogating optical fiber; and one or more processors communicative with the optical fiber interrogator and memory having stored thereon computer program code configured, when executed by the one or more processors, to cause the one or more processors to perform a method. The method comprises, for each of multiple channels of the conduit, each channel comprising a portion of the conduit: obtaining phase data for the channel, the phase data being obtained by causing the optical fiber interrogator to interrogate optical fiber positioned alongside the conduit; and determining one or more baselines from the phase data. As a result, events in the conduit may be detected with fewer false positives.

Method and system for detecting events in a conduit

Methods, systems, and techniques for determining whether an event has occurred from dynamic strain measurements involve determining, using a processor, at least one event parameter from a signal representing the dynamic strain measurements, and then having the processor use the at least one event parameter to determine whether the event has occurred. The at least one event parameter is any one or more of a measure of magnitude of the signal, frequency centroid of the signal, filtered baseline of the signal, harmonic power of the signal, and time-integrated spectrum flux of the signal.

Growing community of inventors

Calgary, Canada

Adekunle Adeyemi