Johns Hopkins University

Adam C Goodwin

Laura Elizabeth Schiffrin Scavo

Soumyadipta Acharya

Margaret Glancey

Collyn J Heier

Tristan Ford

Jewell Brey

An insect trap analysis system may detect an insect specimen on a trap mechanism of an insect trap. The insect trap analysis system may control, based on detecting the insect specimen on the trap mechanism, one or more mechanical devices to: adjust a position of the insect specimen relative to a position of an image capture device associated with the insect trap, or adjust the position of the image capture device relative to the position of the insect specimen. The insect trap analysis system may cause, while controlling the one or more mechanical devices to adjust the position of the image capture device or the position of the insect specimen, the image capture device to capture a plurality of images of the insect specimen from a plurality of different angles relative to the insect specimen, and may perform an action associated with the plurality of images.

Insect specimen analysis system

An electrostatic probe for positioning an insect specimen is disclosed herein. The electrostatic probe may include an ion generator, a handling end, and a controller. The controller may be configured to: activate the ion generator to produce a electrostatic field at the handling end, wherein the electrostatic field is to attract a specimen to the handling end or hold the insect specimen at the handling end, and discharge the electrostatic field to cause the insect specimen to be released from the handling end.

Electrostatic probe for handling or positioning an insect specimen

Growing community of inventors

Baltimore, MD, United States of America

Adam C Goodwin