Nvidia Corporation

Abilash Nerallapally

Shantanu Sarangi

Anitha Kalva

Sailendra Chadalavada

Jae Wu

Milind Sonawane

Chen Fang

Systems and methods are disclosed that relate to testing processing elements of an integrated processing system. A first system test may be performed on a first processing element of an integrated processing system. The first system test may be based at least on accessing a test node associated with the first processing element. The first system test may be accessed using a first local test controller. A second system test may be performed on a second processing element of the integrated processing system. The second system test may be based at least on accessing a second test node associated with the second processing element. The second system test may be accessed using a second local test controller.

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Newark, CA, United States of America

Abilash Nerallapally