Texas Instruments Corporation

Abhinay Patil

Abhishek Kumar

Ankur Chauhan

Subrato Roy

Abhrarup Barman Roy

Mahadev Gopalakrishnan

Kavitha Balaramaiah

Described embodiments include a fault monitoring system comprising a fault logic circuit having a fault logic input adaptable to be coupled to sensor inputs, and first and second fault logic outputs. The fault logic circuit compares a plurality of data values provided by respective sensor inputs to respective fault thresholds, and provides respective fault signals at the first fault logic output responsive to a fault event in which a respective data value exceeds its respective fault threshold. A timer has a timer input coupled to the reset output, and a timer output. A data register has a first data register input coupled to the write control output, a second data register input coupled to the timer output, and a data register output. The data register receives fault data that includes an event identifier, a timer value, and a timer expiration indicator.

System and method for fault sequence recording

The present disclosure relates to configuring parameters of a system. In some examples, a timer duration circuit can be configured to output a timer duration signal defining a time duration for a retry signal based on an impedance of a first circuit coupled at a first node. A logic circuit can be configured to control an output of the retry signal to at least one integrator circuit to control a current to a second node based on one of the timer duration signal and a retry timer signal, and a combination thereof. An output circuit can be configured to output a stop retry signal based on a voltage established by a second circuit at the second node based on its impedance and the current. The stop retry signal can indicate a number of retries that have occurred and can be based on the capacitances of the first and second circuits.

Configurable retry for system operations

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Bengaluru, India

Abhinay Patil