Magic Leap, Inc.

Abhijith Rajiv

Charles David Melville

Brian T Schowengerdt

Sarah Colline McQuaide

Benjamin John Kuehn

Steven Alexander-Boyd Hickman

Mathew David Watson

Emma Rae Mullen

Mina Rohani

A projector including a cantilever position detection system includes a chassis and an actuator mounted to the chassis. The projector also includes a cantilever light source having a longitudinal axis and mechanically coupled to the actuator. The cantilever light source is operable to transmit display light and characterization light. The projector further includes an optical assembly section operable to receive the display light and the characterization light. The optical assembly section includes a dichroic mirror operable to reflect at least a portion of the display light and transmit at least a portion of the characterization light. Moreover, the projector includes a position measurement device operable to receive the transmitted portion of the characterization light.

System for using characterization light to detect fiber position in a fiber scanning projector

A projector includes a cantilever position detection system. The projector also includes a chassis, an actuator mounted to the chassis, and a cantilever light source having a longitudinal axis and mechanically coupled to the actuator. The projector also includes a position measurement region including an aperture, wherein the cantilever light source extends through the aperture, and a plurality of optical source/photodetector pairs disposed in a lateral plane orthogonal to the longitudinal axis.

Method and system for detecting fiber position in a fiber scanning projector

A fiber scanning system includes a fiber optic element having an actuation region and a motion actuator mechanically coupled to the fiber optic element. A continuous bond line is present between the actuation region and the motion actuator. The fiber scanning system also includes a retention collar mechanically coupled to the motion actuator.

Methods and systems for fiber scanners with continuous bond lines

A semiconductor substrate includes a first semiconductor layer, a first dielectric layer coupled to the first semiconductor layer, and a second semiconductor layer coupled to the first dielectric layer. The second semiconductor layer includes a base portion substantially aligned with the first dielectric layer and a cantilever portion protruding from an end of the first dielectric layer. The cantilever portion includes a tapered surface tapering from a bottom surface of the second semiconductor layer toward a top surface of the second semiconductor layer.

Method and system for scanning MEMS cantilevers

A method for fabricating a cantilever having a device surface, a tapered surface, and an end region includes providing a semiconductor substrate having a first side and a second side opposite to the first side and etching a predetermined portion of the second side to form a plurality of recesses in the second side. Each of the plurality of recesses comprises an etch termination surface. The method also includes anisotropically etching the etch termination surface to form the tapered surface of the cantilever and etching a predetermined portion of the device surface to release the end region of the cantilever.

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Seattle, WA, United States of America

Abhijith Rajiv