Growing community of inventors

Ames, IA, United States of America

Abhijit Chandra

Average Co-Inventor Count = 3.65

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 14

Abhijit ChandraAmbar K Mitra (5 patents)Abhijit ChandraAshraf F Bastawros (5 patents)Abhijit ChandraCharles A Lemaire (3 patents)Abhijit ChandraSutee Eamkajornsiri (1 patent)Abhijit ChandraTom I-Ping Shih (1 patent)Abhijit ChandraMuthukkumar Kadavasal (1 patent)Abhijit ChandraCharles A Lamaire (1 patent)Abhijit ChandraCraig D Herreman (1 patent)Abhijit ChandraJoel P Dunham (1 patent)Abhijit ChandraAbhijit Chandra (7 patents)Ambar K MitraAmbar K Mitra (7 patents)Ashraf F BastawrosAshraf F Bastawros (5 patents)Charles A LemaireCharles A Lemaire (123 patents)Sutee EamkajornsiriSutee Eamkajornsiri (1 patent)Tom I-Ping ShihTom I-Ping Shih (1 patent)Muthukkumar KadavasalMuthukkumar Kadavasal (1 patent)Charles A LamaireCharles A Lamaire (1 patent)Craig D HerremanCraig D Herreman (1 patent)Joel P DunhamJoel P Dunham (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Actus Potentia, Inc. (5 from 5 patents)

2. Other (1 from 832,680 patents)

3. Iowa State University Research Foundation, Inc. (1 from 1,388 patents)


7 patents:

1. 9624591 - Method for focused electric-field imprinting for micron and sub-micron patterns on wavy or planar surfaces

2. 9150979 - Apparatus for focused electric-field imprinting for micron and sub-micron patterns on wavy or planar surfaces

3. 8683803 - Method and apparatus for energy harvesting through phase-change induced pressure rise under cooling conditions

4. 8617378 - Method for focused electric-field imprinting for micron and sub-micron patterns on wavy or planar surfaces

5. 8112384 - System and method for problem solving through dynamic/interactive concept-mapping

6. 7998323 - Apparatus for focused electric-field imprinting for micron and sub-micron patterns on wavy or planar surfaces

7. 7544617 - Die scale control of chemical mechanical polishing

Please report any incorrect information to support@idiyas.com
idiyas.com
as of
12/4/2025
Loading…