Sikorsky Aircraft Corporation

Abhijit Bhoite

Kevin Patrick McCormick

Jeremy W Sheaffer

Michael J Moore

Maksim Bobrov

Myra Torres

Nikhil Beke

Timothy Duffy

An inspection apparatus includes an imaging unit producing image signals; a processing unit for receiving the image signal; the imaging unit producing a stack of images of an article at different focal lengths in response to the processing unit; the processing unit generating a depth map from the stack of images; the processing unit analyzing the depth map to derive a depth profile of an object of interest; the processing unit determining a surface mean for the article from the stack of images; and the processing unit characterizing the article as degraded or contaminated in response to the depth profile and the surface mean.

Apparatus and method to automatically distinguish between contamination and degradation of an article

Growing community of inventors

Boise, ID, United States of America

Abhijit Bhoite