Amazon Technologies, Inc.

Aaron T Olds

Muhammad Ali Siddiqui

Miles Childs Kaufmann

Kendra Anne Yourtee

Sanjeev Kewal Verma

Arthur Carré

Mathias G Ricken

Systems and methods are provided for analyzing operating metrics of monitored metric sources. Aspects of the present disclosure may present for display information associated with the monitored metric source and the analysis of its operating metrics. Analysis comprises determination of reference values and tolerance levels which represent allowable deviations from the reference values. Input data includes a measurement of an operating parameter and a time stamp. Input data may be saved to a data store for using in future analysis of other input data. When input data is determined to be outside the tolerance level, notifications may be issued to alert administrators or systems of the anomaly.

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Seattle, WA, United States of America

Aaron T Olds