International Business Machines Corporation

Aaron J Cummings

Michael Richard Ouellette

Kevin William Gorman

Michael Thomas Fragano

Kelly A Ockunzzi

Aspects of the invention provide a bypass structure for a memory device for reducing unknown test values, and a related method. In one embodiment, a bypass structure for a memory device is disclosed. The bypass structure includes: a logic gate configured to receive a test signal and a clock signal; and an output latch configured to receive an output of the logic gate, an output of the memory device, and a bypass data signal, wherein the output latch is configured to hold the bypass data signal and bypass the output of the memory device in response to asserting the test signal, such that unknown data from the output of the memory device is bypassed.

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Williston, VT, United States of America

Aaron J Cummings