Bwxt Nuclear Operations Group, Inc.

Bwxt Nog Technologies, Inc.

Aaron C Havener

Thomas C Mohr

Keith B Rider

James D Jogerst

Wayne M Latham

Timothy A Policke

Richard Manzini

Paul D Sheldon

A method of inspecting a material includes examining a surface of a test material with an eddy current sensor and applying an X-ray fluorescence analysis to the surface of the test material at the same location at which the eddy current examination was performed.

Apparatus and method for inspection of a material

Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.

Apparatus and method for inspection of a film on a substrate

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Pittsburgh, PA, United States of America

Aaron C Havener