Siemens Product Lifecycle Management Software Inc.

Siemens Industry Software Gmbh

Aarcus Kang

Marc Attar

Johan Arendt Grape

Fredrick Pennachi

A system and method is provided that facilitates miter and notch identification for pattern sew line generation. A processor of the system may be configured to access a pattern data that defines a flat shape with cut lines corresponding to locations at which the shape is cut out of a material. Based on the pattern data, the processor may generate a computer-aided-design (CAD) model that includes a plurality of curves that define boundary edges of an object that corresponds to the shape defined by the pattern data. In addition, the processor may automatically identify portions of the boundary edges that correspond to alignment guides including at least one miter alignment guide, notch recess alignment guide, notch projection alignment guide, or combination thereof. Further, the processor may include at least one sew line in the CAD model that is parallel to and offset by the at least one seam allowance distance from at least one boundary edge towards the interior of the CAD model, without being offset by the at least one seam allowance distance from portions of the at least one boundary edge that include the identified alignment guides.

System and method for miter and notch identification for pattern sew line generation

Various disclosed embodiments include a method to be performed by a data processing system and including identifying an original curve and an intended location of a new curve in a CAD model. The method also includes generating a transition curve from the original curve. The method further includes determining a displacement function of the new curve and applying the displacement function to the transition curve. The displacement function includes two or more control points. The method includes combining the two or more control points into one transition curve control point. The method also includes adjusting the transition curve control point based on a fullness value so that transition curve overlays the location of the new curve.

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Concord, MA, United States of America

Aarcus Kang