Samsung Electronics Co., Ltd.

A Santosh Kumar Reddy

Sunil Rajan

Sumanth Chakkirala

Sanjeeb Kumar Ghosh

Gunjan Mandal

Saikat Hazra

Raghavendra Molthati

Praveen S Bharadwaj

Krupal Jitendra Mehta

Parin Rajnikant Bhuta

Built-in-self-test (BIST operations are performed by receiver lanes of a multilane receiver system, wherein at least one receiver lane is configured as a synthesized clock source for other receiver lanes configured to perform BIST operations. The at least one receiver lane configured as the synthesized clock source may generate a clock signal and provide the clock signal to the other receiver lanes performing the BIST operations. In some examples, digital control signals may be used for coordinating the enablement of the at least one receiver lane to function as the synthesized clock source and for coordinating the enablement of the other receiver lanes to perform BIST operations.

Methods and systems for performing built-in-self-test operations without a dedicated clock source

An Alternating Current (AC) and Direct Current (DC) coupled electronic receiver system including a receiver, an AC-coupling capacitor between an input of the receiver system and the receiver, a bypass switch configured to selectively bypass the AC-coupling capacitor to DC-couple the input to the receiver, a bypass switch driving circuit configured to cause the bypass switch to switch 'ON' and thereby DC-couple the input to the receiver, and cause the bypass switch to switch 'OFF' and thereby AC-couple the input to the receiver, and a voltage-following transistor between a source and a gate of the bypass switch configured to maintain an &#x2018;OFF&#x2019; state of the bypass switch while the input is AC-coupled.

Receiver systems and methods for AC and DC coupling of receiver

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Andhra Pradesh, India

A Santosh Kumar Reddy