Huron Technologies International Inc.

A E Dixon

Savvas Damaskinos

Jasper Hayes

Alfonso Carlos Ribes

According to one aspect, an instrument for scanning a specimen. The instrument includes a scanning stage for supporting the specimen, a detector having a plurality of pixels, the scanning stage and the detector movable relative to each other to move the specimen in a scan direction during a scan, and a pulsed illumination source synchronized with the motion of the specimen on the scanning stage. At least some of the pixels of the detector are operable to collect light emitted from the specimen during the scan due to the pulsed illumination source and generate corresponding image data. The instrument may further include a processor operable to perform MSIA on the image data to generate an image of the specimen.

Scanning microscope using pulsed illumination and MSIA

According to some examples, an instrument for scanning a specimen on a specimen holder. The instrument includes a scanning stage for supporting the specimen, and a detector having a plurality of pixels. The scanning stage and the detector are movable relative to each other to move the specimen in a scan direction during a scan. At least some of the pixels of the detector are operable to collect light from different depths inside the specimen during the scan and generate corresponding image data. The instrument also includes a processor operable to perform MSIA on the image data to generate a 3D image of the specimen.

Growing community of inventors

Waterloo, Canada

A E Dixon