Kyu-Baik Chang

Title: Kyu-Baik Chang: Innovator in Wafer Defect Testing

Introduction

Kyu-Baik Chang is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in wafer defect testing. With a total of 5 patents to his name, Chang's work has advanced the methods used in the fabrication and testing of wafers.

Latest Patents

Chang's latest patents include a wafer defect test apparatus, a wafer defect test system, a wafer test method, and a fabrication method of a wafer. His wafer defect test apparatus is designed to improve defect prediction performance while shortening simulation time. This innovative apparatus includes a wafer variable generator that processes structural measurement data and process condition data from multiple wafers. It generates various process variables and calculates an abnormal wafer index based on these variables. Additionally, Chang has developed methods for detecting stresses in integrated circuits, which involve determining stress detection points and calculating stress levels based on the areas of patterns formed from different materials.

Career Highlights

Kyu-Baik Chang is currently employed at Samsung Electronics Co., Ltd., where he continues to push the boundaries of semiconductor technology. His work has been instrumental in enhancing the efficiency and accuracy of wafer testing processes.

Collaborations

Chang collaborates with notable colleagues, including Joon-Sung Lim and Jang-Gn Yun, who contribute to his innovative projects and research endeavors.

Conclusion

Kyu-Baik Chang's contributions to wafer defect testing and semiconductor technology have established him as a key figure in the industry. His innovative patents and ongoing work at Samsung Electronics Co., Ltd. continue to shape the future of semiconductor manufacturing.