Company Filing History:
Years Active: 2013-2021
Title: Inventor Jérôme Hazart: Pioneering Advances in Dimensional Metrology
Introduction
Jérôme Hazart, an innovative inventor based in Eybens, France, has made significant contributions to the field of dimensional metrology. With a total of four patents to his name, his work centers around the advanced techniques of scanning electron microscopy, particularly in the critical dimension scanning electron microscopy (CD-SEM) domain.
Latest Patents
Jérôme's latest patents reflect his expertise in the implementation of CD-SEM characterization techniques. One noteworthy invention is his method for implementing a CD-SEM characterization technique. This approach aims to determine at least one critical dimension of a sample's structure. The method involves producing an experimental image from a scanning electron microscope and developing a theoretical model based on parametric mathematical functions. It further includes an algebraic summation of a corrective term, which establishes a connection between the theoretical model and the experimental image.
Additionally, he has developed a method for characterization by CD-SEM scanning electron microscopy, emphasizing the creation of an experimental image derived from a theoretical model. This model describes the measured signal at specific positions and times, employing a corrective term that accounts for the signal from electric charges deposited by the primary electron beam.
Career Highlights
Throughout his career, Jérôme Hazart has worked with esteemed organizations, notably the Commissariat à l'Énergie Atomique et aux Énergies Alternatives. His association with these institutions has provided him the platform to push the boundaries of research in dimensional metrology, solidifying his reputation as a leading figure in the field.
Collaborations
Jérôme has collaborated with notable peers, including Patrick Quemere and Johann Foucher. These partnerships have enabled him to refine his methodologies and innovate within the realm of electron microscopy techniques, enhancing the accuracy and reliability of dimensional measurements.
Conclusion
In summary, Jérôme Hazart stands out as a distinguished inventor whose contributions to scanning electron microscopy have paved the way for advancements in the measurement and characterization of critical dimensions. His ongoing research and innovation continue to influence the technological landscape in dimensional metrology.
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