Dhirendra K Pandey

Title: Dhirendra K Pandey: Innovator in Spectral Emissivity Measurement

Introduction

Dhirendra K Pandey is a notable inventor based in Hampton, VA (US). He has made significant contributions to the field of emissivity measurement through his innovative patent. His work focuses on enhancing the accuracy and efficiency of measuring the emissivity of test specimens.

Latest Patents

Dhirendra K Pandey holds a patent for a "Directional spectral emissivity measurement system." This apparatus and process are designed for determining the emissivity of a test specimen. It includes an integrated sphere with two concentric walls that have coolant circulating between them. The system operates within a chamber that can be under ambient, vacuum, or inert gas conditions. A reference sample is placed within the sphere, aligned with a monochromatic light source. A pyrometer is also in optical alignment with the test sample, allowing for continuous temperature measurements during testing. The design features an arcuate slit port through the concentric walls, with a movable monochromatic light source that can be adjusted along the port. Additionally, a detector system is integrated to continuously detect an integrated signal indicative of all radiation within its field of view, based on the emissivity of the test specimen at various temperatures and angles. The system also includes a furnace capable of heating the test sample to approximately 3000 K, along with a control mechanism for transferring the heated sample to the test sample port in the integrating sphere.

Career Highlights

Dhirendra K Pandey is associated with Information and Control Systems, Inc., where he applies his expertise in the field of emissivity measurement. His innovative approach has led to advancements in the technology used for thermal measurements.

Collaborations

Dhirendra has collaborated with Nesim Halyo, contributing to the development and refinement of his patented technology.

Conclusion

Dhirendra K Pandey's work in spectral emissivity measurement represents a significant advancement in the field. His innovative patent showcases his dedication to improving measurement techniques and enhancing the understanding of thermal properties in materials.