Elad, Israel

Avraham Chelly


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 19(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Avraham Chelly: Innovator in Photodetector Technology

Introduction

Avraham Chelly is a notable inventor based in Elad, Israel. He has made significant contributions to the field of photodetector technology, particularly in the context of scanning probe microscopy. His innovative work has led to the development of a unique detector device that enhances the capabilities of surface probing systems.

Latest Patents

Chelly holds a patent for a photodetector designed for use in a scanning probe microscope. This detector device features an integral semiconductor structure that defines a cantilever and tip probe assembly. The assembly includes at least one tip, which is configured as an apertured photodetector. This photodetector comprises a layered structure with a subwavelength aperture that allows for the collection of evanescent waves created at a surface region. The interaction of these waves with the depletion region results in the direct conversion of the collected waves into electric signals, which can be read by the electrical circuit within the tip apex portion. This innovative design enables concurrent monitoring of both topographic and optical properties of the scanned surface.

Career Highlights

Throughout his career, Avraham Chelly has worked with several esteemed institutions, including the Jerusalem College of Technology, Lev Academic Center, and Bar-Ilan University. His experience in these organizations has contributed to his expertise in the field of photodetector technology and surface probing systems.

Collaborations

Chelly has collaborated with notable colleagues such as Zeev Zalevsky and Avi Karsenty. These partnerships have further enriched his research and development efforts in the field.

Conclusion

Avraham Chelly's contributions to photodetector technology exemplify his innovative spirit and dedication to advancing scientific knowledge. His work continues to influence the field of scanning probe microscopy and enhances our understanding of surface properties.

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